EN
Product Overview
The Semiconductor Automated Test & Sorting Equipment is designed for functional testing and automated sorting of IC devices.
It supports parallel testing and automatic sorting under room-temperature, high-temperature, and multi-temperature test conditions. The system features a flexible and scalable hardware architecture and supports up to 128 devices under parallel test, helping improve test efficiency and throughput for high-volume production of multiple IC types and specifications.
Core Specifications
parameter | Specification |
Dimensions (W × D × H) | 2800 × 2570 × 2000 mm (Customizable) |
Control System | PC + PLC |
Material tray stacker crane | Tray Stacker Units |
Test Fixtures | 16 Sets, Supporting Up to 128 DUTs in Parallel |
Repeatability | ±0.03 mm |
Throughput | Up to 3000 pcs/h |
Power Supply | AC 220 V, 50/60 Hz |
Rated Power | 5000 W |
Air Supply | 0.5–0.7 MPa |
Application Scenarios
Widely used for device-level and system-level testing of various semiconductor products, including:
SOC / MCU, Flash Memory, EEPROM, Logic ICs, CPLD / FPGA, PMIC, PA, RF Switches, and other semiconductor devices and modules.
Tel：173 9470 0835
E-mail：support@lk-tek.com
Add：No. 246 Wencheng East Road, Siyang County Economic Development Zone, Suqian City, Jiangsu Province
