Designed for precision electronic components, PCBAs, and core semiconductor hardware testing applications, this solution provides comprehensive validation across static parameters, dynamic timing characteristics, power performance, bus communication, and NFC interaction. It enables standardized, high-precision, full-featured testing and verification for advanced electronic products.

1. Applicable Product Categories

The solution supports a wide range of electronic hardware products, including precision resistors, capacitors, diodes, MOSFETs, and other discrete components, as well as main control ICs, SoC chips, functional boards, motherboards, NFC-enabled terminals, and high-/low-speed bus interface circuits. It is suitable for small- and medium-volume batch testing applications.

2. Comprehensive Testing Capabilities

The solution covers fundamental static parameter measurement of electronic components, four-quadrant power characteristic analysis, dynamic timing waveform measurement, clock frequency calibration, high- and low-speed bus communication testing, and NFC interaction performance evaluation, providing complete electrical performance verification for precision electronic hardware.

3. Key Testing Capabilities

Component Parameter Testing

Provides accurate measurement and screening of key parameters, including resistance, capacitance, conduction characteristics, voltage withstand capability, and loss characteristics for precision components such as resistors, capacitors, diodes, and MOSFETs.

Four-Quadrant Power Characteristic Testing

Supports precision testing based on four-quadrant voltage and current source technology, simulating complex power supply conditions to evaluate circuit stability, load adaptability, and power performance.

Timing and Frequency Characterization

Performs rise/fall time measurement, clock frequency accuracy verification, time-domain waveform acquisition, and signal analysis to accurately identify timing abnormalities and waveform distortion.

Bus Interface Performance Testing

Supports low-, medium-, and high-speed bus interfaces, providing comprehensive verification of interface control, data transmission performance, communication stability, and signal integrity.

NFC Interaction Performance Testing

Provides dedicated testing for NFC read/write operations, interaction sensitivity, communication compatibility, and transmission reliability, ensuring stable near-field communication performance.

In-House Electronic Testing System

1. Self-Developed Core Testing Instruments

Based on Liankang's independently developed high-precision electronic testing instruments, the system enables high-resolution measurement of component parameters, dynamic waveforms, and precise power characteristics.

The equipment provides excellent accuracy, stability, and repeatability, meeting both R&D calibration requirements and mass production quality inspection needs for precision electronic products.

2. Dedicated Test Board System

Customized test boards integrate four-quadrant voltage/current source modules, timing acquisition modules, clock frequency measurement units, and multi-range bus control modules.

The integrated architecture enables synchronized, one-stop testing of multiple parameters, replacing multiple standalone instruments, simplifying test systems, and improving measurement consistency and efficiency.

3. Specialized Functional Testing Support

Equipped with dedicated NFC test modules, high-/low-speed bus controllers, customized test fixtures, and integrated software platforms, the system supports automated data acquisition, waveform replay, parameter comparison, and defect classification.

It enables standardized end-to-end testing for complex electronic hardware products.

Key Advantages

Fully In-House R&D with Controllable Testing Accuracy

Core testing instruments, functional boards, and test control systems are independently developed by Liankang, eliminating integration uncertainties from third-party systems and ensuring accurate, reliable, repeatable, and traceable test results.

One-Stop Integrated Testing Across Multiple Requirements

Combines static component measurement, dynamic timing analysis, power characteristic testing, bus communication verification, and NFC functional testing into a unified platform, eliminating fragmented multi-instrument testing architectures.

Suitable for Both R&D Verification and Mass Production

Meets high-precision calibration requirements during SoC and precision component development while supporting standardized quality screening for small- and medium-volume production, ensuring consistent testing standards from R&D to manufacturing.

Precise Dynamic Waveform Acquisition

Accurately captures transient electrical characteristics, including rise/fall edges, time-domain waveforms, and clock frequencies, enabling detection of hidden electrical issues.

It addresses the limitations of traditional testing methods that focus only on static parameters while overlooking dynamic performance characteristics.

Flexible Adaptation for Diverse Testing Scenarios

Provides configurable test items and hardware modules based on customer product types, testing standards, and production requirements, supporting customized testing solutions for various precision electronic hardware applications.

Application Scenarios

The solution is widely used in precision electronic hardware testing applications, including:

• Parameter testing of semiconductor discrete components;
• Electrical performance calibration of SoC chips;
• Circuit board timing and waveform analysis;
• Bus interface performance verification;
• NFC functional reliability testing;
• Quality screening for small- and medium-volume production.

It provides essential testing support for quality control, performance optimization, and reliable mass production of precision electronic products in semiconductor, consumer electronics, automotive electronics, and other advanced manufacturing industries.