With the continuous deepening of millimeter wave technology in electronic products, electronic motherboard testing has put forward higher requirements for RF isolation, testing consistency, and batch testing efficiency. During actual testing, multiple motherboards working simultaneously can easily generate millimeter wave signals that interfere with each other; At the same time, motherboard positioning, testing connections, pressing, and heat dissipation also directly affect testing stability and production efficiency. In response to the above requirements, the R&D team of Liankang Information integrates millimeter wave shielding, motherboard positioning, probe testing, pneumatic compression and heat dissipation structures into one, providing a stable and efficient testing solution for millimeter wave functional testing of electronic motherboards. The related innovative achievements have been granted national invention patent authorization, with the patent name of "A Millimeter Wave Function Testing Fixture for Electronic Motherboards" and patent number ZL 202011425253.5.

From signal isolation to multi board parallel testing: integrated fixture improves millimeter wave testing efficiency

01. Reduce signal interference in multi board testing

Millimeter wave testing is more sensitive to the environment. When multiple tested motherboards are in the same testing environment, the RF signals between different motherboards may affect each other, thereby interfering with the test results. This patent sets up a millimeter wave shielding box in the fixture and forms multiple relatively independent shielding cavities inside. An absorbing structure is installed inside the cavity, and the millimeter wave antennas on the tested motherboard correspond to the corresponding testing spaces. During testing, the download board and millimeter wave shielding box form a relatively enclosed testing environment, thereby reducing millimeter wave signal interference between different tested motherboards and providing more stable testing conditions for RF performance testing.

02. Support synchronous testing of multiple motherboards

The traditional single board one by one testing method is prone to testing cycle limitations in mass production. This fixture uses a multi cavity structure to place different tested motherboards in relatively independent millimeter wave testing spaces, reducing mutual interference while supporting synchronous millimeter wave functional testing of multiple electronic motherboards. Compared to the single board testing method, this solution can increase the number of single tests, shorten the batch testing cycle, and is more suitable for production testing and automated testing scenarios.

03. Integrated positioning, connection, and compression functions

In addition to the millimeter wave shielding structure, this patent also integrates the motherboard positioning, electrical connection, and testing pressing functions into the same fixture. Fix and position the tested motherboard through the download board, upload board module, and guiding positioning structure; The test probes in the upload board module make contact with the test points on the motherboard to achieve power on and test signal connection. At the same time, the fixture adopts a pneumatic structure to complete compression and reset, so that the product maintains a relatively consistent testing position during repeated testing, which is conducive to improving testing repeatability and reducing manual compression operations.

04. Take into account the heat dissipation requirements during continuous testing

The electronic motherboard generates heat during continuous power on testing, and the temperature rise may further affect the testing status. In response to this issue, the fixture is equipped with corresponding air ducts and cooling structures to cool the tested electronic motherboard through airflow, taking into account the heat dissipation requirements during continuous testing and providing more stable working conditions for batch testing.

The diagram shows the unfolded structure of the testing fixture for this patent (including 1-fixture chassis, 2-fixture base, 3-U-plate sliding component, 4-millimeter wave shielding box, 5-download board, and 6-upper needle board carrier module)

Application Scenarios

From practical applications, this patent is not a single millimeter wave shielding structure, but integrates functions such as RF isolation, multi board testing, motherboard positioning, electrical connections, pneumatic compression, and heat dissipation. Its main application value is reflected in: reducing signal interference: improving the isolation of millimeter wave testing environment through independent shielding cavity and absorbing structure; Improve testing efficiency: support synchronous testing of multiple motherboards, increase the coverage of a single test; Improve testing consistency: reduce positional differences in repeated testing through fixed positioning, probe connections, and pneumatic compression; Suitable for mass production: Integrated testing connection, control, and heat dissipation functions, more convenient for application in production testing and automation testing scenarios. For millimeter wave motherboard testing, the testing plan not only needs to meet functional testing requirements, but also needs to balance isolation, stability, and production efficiency. Liankang Information further enhances the stability and batch testing capabilities of millimeter wave motherboard testing through the integrated design of millimeter wave shielding structures and testing fixtures, providing technical support for the research and production testing of related electronic products.