Invention Patent | Design and Application of an Integrated Test Fixture for Millimeter-Wave Electron

2026-09-11

With the continuous deepening of millimeter wave technology in electronic produc

View details >>

【 Product Introduction 】 Electronic testing local hot spot temperature control: no moving parts vort

2026-09-11

In the research and production testing of electronic products, chips, power devi

View details >>

【 Technical Solution 】 Probe Card Comprehensive Testing Machine: 6000TP High Density Probe Card Mult

2026-09-11

In the semiconductor testing process, the probe card is responsible for the elec

View details >>

35W-550W Liankang Information Power Products: Single/Dual/Programmable Power Selection Guide

2026-09-11

In the process of electronic product development, functional testing, and equipm

View details >>

From connection to testing: What problem does the RF testing fixture solve?

2026-09-11

In RF testing, testing instruments are often the most easily scrutinized. The eq

View details >>

One interface, one 'vulnerability'? Why can't the holes on the shielding box be opened casually

2026-09-11

The shielding box needs to be well shielded, and the most ideal state seems to b

View details >>

[Invention Patent] Integrated Fixture Design and Application for Millimeter Wave Electronic Motherbo

2026-09-11

With the continuous deepening of millimeter wave technology in electronic produc

View details >>

From 700MHz to 50GHz: Configuration and Selection of OTA/RAT Wireless Test Antennas

2026-09-11

In wireless testing scenarios such as OTA and RAT, antennas not only perform sig

View details >>

How can these three invention patent applications connect the Bluetooth comprehensive testing instru

2026-09-11

When a Bluetooth synthesizer receives wireless signals in the air, it is not fac

View details >>